These are stress ratings only and functional operation of the device at these conditions is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability.
Symbol | Ratings | Min | Max | Unit |
---|---|---|---|---|
Storage temperature range | -55 | +150 | ℃ | |
Maximum junction temperature under bias | -40 | +150 | ℃ |
Symbol |
Parameter |
Conditions1 |
Condition2 |
Typ |
Unit |
---|---|---|---|---|---|
Supply current | After enter deep sleep mode All peripheral clocks OFF |
- | 2.49 |
Symbol |
Parameter |
Min |
Unit |
---|---|---|---|
Sector Endurance |
10,000 |
Cycles |
|
Data Retention |
10 |
Years |
Symbol |
Parameter |
Test Method |
Min |
Max |
Unit |
---|---|---|---|---|---|
Electostatic discharge (Human body model) |
AEC-Q100-002 |
±2000 | - |
V |
|
Electostatic discharge (Charge device model) |
AEC-Q100-011 |
±500 |
- |
V |
Symbol |
Parameter |
Test Method |
Min |
Max |
Unit |
---|---|---|---|---|---|
Latch up current at 125℃ ambient temperature | AEC-Q100-004 |
- |
V |
Symbol | Dimension (MM) | Dimension (MIL) | ||||
---|---|---|---|---|---|---|
Min | Nom | Max | Min | Nom | Max | |
A |
1.20 |
47.2 |
||||
A1 |
0.05 |
0.10 |
0.15 |
2.0 |
3.9 |
5.9 |
A2 |
0.95 |
1.00 |
1.05 |
37.4 |
39.4 |
41.3 |
b |
0.13 |
0.18 |
0.23 |
5.1 |
7.1 |
9.1 |
b1 |
0.13 |
0.16 |
0.19 |
5.1 |
6.3 |
7.5 |
c |
0.09 |
0.20 |
3.5 |
7.9 |
||
c1 |
0.09 |
0.16 |
3.5 |
6.3 |
||
D |
8.90 |
9.00 |
9.10 |
350.4 |
354.3 |
358.3 |
D1 |
6.90 |
7.00 |
7.10 |
271.7 |
275.6 |
279.5 |
![]() |
0.35 |
0.40 |
0.45 |
13.8 |
15.7 |
17.7 |
L |
0.45 |
0.60 |
0.75 |
17.7 |
23.6 |
29.5 |
L1 |
0.90 |
1.00 |
1.10 |
35.4 |
39.4 |
43.3 |
R1 |
0.08 |
3.1 |
||||
R2 |
0.08 |
0.20 |
3.1 |
7.9 |
||
Y |
0.08 |
3.1 |
||||
θ |
0° |
3.5° |
7° |
0° |
3.5° |
7° |
θ1 |
0° |
0° |
||||
θ2 |
11° |
12° |
13° |
11° |
12° |
13° |
θ3 |
11° |
12° |
13° |
11° |
12° |
13° |